Structural stability of heat-treated W/C and W/B4C multilayers
- 15 November 1990
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 68 (10) , 5162-5168
- https://doi.org/10.1063/1.347057
Abstract
The utilization of W/C and W/B4C multilayer structures as Bragg diffractors rests in their reflective efficiency and dependability, both of which rely on the stability of the layered structure. The layers within the vapor deposited multilayers, often amorphous, are typically metastable, hence susceptible to thermally induced structural change. In fact, crystallization and compound formation are known to occur in annealed multilayer systems. In this study, multilayers of W/C and W/B4C were vacuum heat treated, then structurally examined. A comparison between the pre‐ and post‐heat‐treated structures of the two multilayer systems is accomplished using diffraction, depth profiling, and microscopy. Our results indicate structural stability in the W/B4C multilayers, after heat treatment, in comparison with structural degradation noted in the W/C system.This publication has 15 references indexed in Scilit:
- Interfacial bonding in W/C and W/B4C multilayersJournal of Vacuum Science & Technology A, 1989
- Tungsten-carbon multilayer composition and the effects of annealing: A glancing angle extended x-ray absorption fine structure studyJournal of Applied Physics, 1989
- The structure of ultrathin C/W and Si/W multilayers for high performance in soft x-ray opticsJournal of Applied Physics, 1989
- High Resolution Electron Microscopy Study of As-Prepared and Annealed Tungsten-Carbon NultilayersMRS Proceedings, 1989
- Characterization of Mo/Si Multilayer Structures by High-Resolution Electron MicroscopyMRS Proceedings, 1989
- Full Potential, Total Energy Lmto Calculation of Interface Structure in Ti-C and W-C SuperlatticesMRS Proceedings, 1988
- High-resolution electron microscopy study of x-ray multilayer structuresJournal of Applied Physics, 1987
- Tungsten-Carbon Multiiayer System Studied with X-Ray ScatteringMRS Proceedings, 1987
- A Unified Geometrical Insight for the Design of Toroidal Reflectors with Multilayered Optical Coatings: Figured X-ray OpticsPublished by SPIE-Intl Soc Optical Eng ,1985
- THERMAL, STABILITY OF W/C MULTILAYER FILMSMRS Proceedings, 1985