Morphological effects in the quantum yield of cesium iodide
- 1 July 1995
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 361 (3) , 524-538
- https://doi.org/10.1016/0168-9002(95)00141-7
Abstract
No abstract availableThis publication has 24 references indexed in Scilit:
- Characteristics of secondary electron emission from CsI induced by x rays with energies up to 100 keVJournal of Applied Physics, 1993
- Monte Carlo simulations of secondary electron emission from CsI, induced by 1–10 keV x rays and electronsJournal of Applied Physics, 1992
- An electrostatic microscope for synchrotron radiation x-ray absorption microspectroscopy (invited)Review of Scientific Instruments, 1992
- A new ESCA instrument with improved surface sensitivity, fast imaging properties and excellent energy resolutionJournal of Electron Spectroscopy and Related Phenomena, 1990
- The soft X-ray detection efficiency of coated microchannel platesNuclear Instruments and Methods in Physics Research, 1984
- The characterisation of soft X-ray photocathodes in the wavelength band 1–300 Å: II. Caesium iodide and other insulators of high photoelectric yieldNuclear Instruments and Methods in Physics Research, 1983
- The characterisation of soft X-ray photocathodes in the wavelength band 1–300 Å: I. Lead glass, lithium fluoride and magnesium fluorideNuclear Instruments and Methods in Physics Research, 1983
- The multistep avalanche chamber as a detector for thermal neutronsNuclear Instruments and Methods in Physics Research, 1981
- A New Photocathode for X-ray Image Intensifies Operating in the 1–50 keV RegionPublished by Elsevier ,1980
- Soft-x-ray-induced secondary-electron emission from semiconductors and insulators: Models and measurementsPhysical Review B, 1979