Dynamic scanning force microscopy at low temperatures on a van der Waals surface: graphite (0001)
- 1 February 1999
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 140 (3-4) , 247-252
- https://doi.org/10.1016/s0169-4332(98)00535-2
Abstract
No abstract availableThis publication has 17 references indexed in Scilit:
- Consequences of the stick-slip movement for the scanning force microscopy imaging of graphitePhysical Review B, 1998
- Atom-Resolved Image of theSurface by Noncontact Atomic Force MicroscopyPhysical Review Letters, 1997
- A low-temperature ultrahigh-vacuum scanning tunneling microscope with rotatable magnetic fieldReview of Scientific Instruments, 1997
- Fiber interferometer-based variable temperature scanning force microscopeReview of Scientific Instruments, 1997
- Ultrahigh vacuum scanning force microscope with fiber-optic deflection sensorReview of Scientific Instruments, 1996
- Defect Motion on an InP(110) Surface Observed with Noncontact Atomic Force MicroscopyScience, 1995
- Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force MicroscopyScience, 1995
- A miniature fibre optic force microscope scan headMeasurement Science and Technology, 1993
- Frequency modulation detection using high-Q cantilevers for enhanced force microscope sensitivityJournal of Applied Physics, 1991
- Atomic Force MicroscopePhysical Review Letters, 1986