A gate-level simulation environment for alpha-particle-induced transient faults
- 1 January 1996
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. 45 (11) , 1248-1256
- https://doi.org/10.1109/12.544481
Abstract
No abstract availableThis publication has 14 references indexed in Scilit:
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