A Functional Form Approach to Test Set Coverage in Tree Networks
- 1 January 1979
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. C-28 (1) , 50-52
- https://doi.org/10.1109/tc.1979.1675221
Abstract
To efficiently perform the fault analysis of digital networks it is necessary that pertinent fault interrelationships be utilized. However, to determine these fault interrelationships can entail an analysis which is quite complex and thereby reduces the overall advantage of utilizing the gained insights in a fault analysis process. In this paper we suggest an approach to establishing the existence of a certain fault interrelationship relative to test set coverage in tree networks which is based only on the form of the output function. A procedure is given for generating a form expression (called an L-expression) corresponding to that function. A theorem is stated regarding the interpretation of these form expressions relative to test set coverage.Keywords
This publication has 9 references indexed in Scilit:
- The combinations of resistancesDiscrete Applied Mathematics, 1994
- Resolution-Oriented Fault Interrelationships in Combinational Logic NetworksIEEE Transactions on Computers, 1977
- The Boolean Difference and Multiple Fault AnalysisIEEE Transactions on Computers, 1975
- Redundancy Testing in Combinational NetworksIEEE Transactions on Computers, 1974
- Multiple Fault Detection in Combinational NetworksIEEE Transactions on Computers, 1972
- Fault Equivalence in Combinational Logic NetworksIEEE Transactions on Computers, 1971
- On the Design of Multiple Fault Diagnosable NetworksIEEE Transactions on Computers, 1971
- An Efficient Algorithm for Generating Complete Test Sets for Combinational Logic CircuitsIEEE Transactions on Computers, 1971
- The Number of Two‐Terminal Series‐Parallel NetworksJournal of Mathematics and Physics, 1942