Interstitial O in Si and its interactions with H
- 15 May 1990
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 41 (14) , 9886-9891
- https://doi.org/10.1103/physrevb.41.9886
Abstract
Interactions between interstitial H and interstitial O in crystalline silicon have been studied at the approximate ab initio (parameter-free) Hartree-Fock level in three clusters containing 5, 26, and 35 host atoms, respectively. The key results are (1) no configurations with significant O-H bonding are energetically favorable and (2) the activation energy for diffusion of interstitial O is considerably lower when H is present than when it is not. It is estimated that H enhances the diffusivity of interstitial O by several orders of magnitude. The results provide insights into the interpretation of the recently observed enhancement by atomic hydrogen of the rate of formation of thermal donors in silicon.Keywords
This publication has 41 references indexed in Scilit:
- Theoretical study of oxygen in silicon: Breaking of the Si—Si bondPhysical Review B, 1987
- Is enhanced interstitial oxygen diffusion necessary to explain the kinetics of precipitation in silicon at temperatures below 650 degrees C?Semiconductor Science and Technology, 1987
- Cluster Computations Related to Silicon Thermal DonorsMRS Proceedings, 1985
- Diffusivity of oxygen in silicon at the donor formation temperatureApplied Physics Letters, 1983
- Excess solubility of oxygen in silicon during steam oxidationApplied Physics Letters, 1982
- Diffusivity of oxygen in silicon during steam oxidationApplied Physics Letters, 1982
- Absorption of oxygen in silicon in the near and the far infraredProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1970
- The configuration and diffusion of isolated oxygen in silicon and germaniumJournal of Physics and Chemistry of Solids, 1964
- Evidence for Internal Rotation in the Fine Structure of the Infrared Absorption of Oxygen in SiliconThe Journal of Chemical Physics, 1960
- Infrared Absorption and Oxygen Content in Silicon and GermaniumPhysical Review B, 1956