Growth and Crystallographic Analysis of YBa2Cu3Ox Thin Films on NdGaO3 Substrates

Abstract
The growth and crystallographic analysis of a-axis-oriented YBa2Cu3O x (abbreviated to YBCO) grains in c-axis-oriented films on NdGaO3 substrates is described. a-axis-oriented grains grow at high substrate temperatures and high oxygen pressures. Reflection high energy electron diffraction (RHEED) patterns and φ-scan (in-plane rotation) X-ray measurements reveal that the grains exhibit a twofold symmetry indicating independent b- and c-axis orientations in the surface plane. The in-plane orientation of a-axis-oriented grains is thought to be responsible for the rectangular surface lattice of (110) NdGaO3 substrate.
Keywords