Ellipsometric analysis of thin silicon dioxide layers
- 1 May 1982
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 91 (4) , 327-334
- https://doi.org/10.1016/0040-6090(82)90255-3
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
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- Berechnung verschiedener physikalischer Konstanten von heterogenen Substanzen. I. Dielektrizitätskonstanten und Leitfähigkeiten der Mischkörper aus isotropen SubstanzenAnnalen der Physik, 1935