Rotating-compensator/analyzer fixed-analyzer ellipsometer: Analysis and comparison to other automatic ellipsometers
- 1 September 1976
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America
- Vol. 66 (9) , 949-954
- https://doi.org/10.1364/josa.66.000949
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 18 references indexed in Scilit:
- A photometric ellipsometer for measuring flux in a general state of polarizationSurface Science, 1976
- Photometric ellipsometer for measuring partially polarized lightJournal of the Optical Society of America, 1975
- A rotating-compensator fourier ellipsometerOptics Communications, 1975
- Analysis of a novel ellipsometric technique with special advantages for infrared spectroscopyJournal of the Optical Society of America, 1975
- Optimizing precision of rotating-analyzer ellipsometersJournal of the Optical Society of America, 1974
- Design and Operation of ETA, an Automated EllipsometerIBM Journal of Research and Development, 1973
- Fourier transform detection system for rotating-analyzer ellipsometersOptics Communications, 1973
- Measurement and Correction of First-Order Errors in EllipsometryJournal of the Optical Society of America, 1971
- Definitions and conventions in ellipsometrySurface Science, 1969
- On the Use of a Rotating Polarizer to Measure Optical Constants in the InfraredJournal of the Optical Society of America, 1954