A photometric ellipsometer for measuring flux in a general state of polarization
- 30 June 1976
- journal article
- Published by Elsevier in Surface Science
- Vol. 56, 161-169
- https://doi.org/10.1016/0039-6028(76)90443-x
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Present status of automatic ellipsometersSurface Science, 1976
- Photometric ellipsometer for measuring partially polarized lightJournal of the Optical Society of America, 1975
- Precision Bounds to Ellipsometer SystemsApplied Optics, 1975
- Fourier transform detection system for rotating-analyzer ellipsometersOptics Communications, 1973
- Influence of Oxide Layers on the Determination of the Optical Properties of SiliconJournal of Applied Physics, 1972
- Measurement and Correction of First-Order Errors in EllipsometryJournal of the Optical Society of America, 1971
- Definitions and conventions in ellipsometrySurface Science, 1969