Study of PtSi/Si(100) Interfaces by Ballistic -Electronemission Microscopy

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1 January 1993

journal article
Published by Springer Nature in MRS Proceedings

Vol. 320
https://doi.org/10.1557/proc-320-217

Abstract

No abstract available

Keywords

This publication has 8 references indexed in Scilit:

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Electron-hole pair creation and metal/semiconductor interface scattering observed by ballistic-electron-emission microscopy
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Role of elastic scattering in ballistic-electron-emission microscopy of Au/Si(001) and Au/Si(111) interfaces
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The dependence of the Schottky emission coefficient on reverse bias
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Observation of Interface Band Structure by Ballistic-Electron-Emission Microscopy
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Direct investigation of subsurface interface electronic structure by ballistic-electron-emission microscopy
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