Plasma-deposited fluorocarbon films on silicon studied by ellipsometry
- 1 October 1986
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 143 (3) , 269-278
- https://doi.org/10.1016/0040-6090(86)90180-x
Abstract
No abstract availableThis publication has 12 references indexed in Scilit:
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