High resolution studies of interfacial effects by small and large angle X-ray diffraction
- 1 October 1991
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 204 (2) , 473-484
- https://doi.org/10.1016/0040-6090(91)90085-c
Abstract
No abstract availableThis publication has 15 references indexed in Scilit:
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