Remeasurement of characteristic X-ray emission lines and their application to line profile analysis and lattice parameter determination
- 16 May 1994
- journal article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 143 (1) , 23-34
- https://doi.org/10.1002/pssa.2211430104
Abstract
No abstract availableKeywords
This publication has 19 references indexed in Scilit:
- Remeasurement of the profile of the characteristic CuKα emission line with high precision and accuracyJournal of Applied Crystallography, 1993
- Remeasurement of the CuKα1 Emission X-Ray Wavelength in the Metrical System (Present Stage)Physica Status Solidi (a), 1991
- Structure and wavelength of the Cu Kx-ray emission linePhysical Review A, 1988
- Study of the Kα emission spectrum of copperX-Ray Spectrometry, 1986
- Wavelength, energy shape, and structure of thex-ray emission linePhysical Review B, 1982
- Determination of crystallite size and lattice distortions through X-ray diffraction line profile analysisAnalytical and Bioanalytical Chemistry, 1982
- A rapid method for analysing the breadths of diffraction and spectral lines using the Voigt functionJournal of Applied Crystallography, 1978
- A Simplex Method for Function MinimizationThe Computer Journal, 1965
- The Separation of Cold-Work Distortion and Particle Size Broadening in X-Ray PatternsJournal of Applied Physics, 1952
- The Effect of Cold-Work Distortion on X-Ray PatternsJournal of Applied Physics, 1950