Properties of thin film thermoelectric materials: application to sensors using the Seebeck effect
- 1 March 1992
- journal article
- Published by Elsevier in Materials Science and Engineering: B
- Vol. 13 (2) , 103-111
- https://doi.org/10.1016/0921-5107(92)90149-4
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
- Structural and electrical properties of bismuth telluride films grown by the molecular beam techniqueJournal of Materials Science Letters, 1988
- Thin-film thermopiles for measuring high laser powersSensors and Actuators, 1988
- Thermal Conductivity and Thermoelectric Figure of Merit of Bi1−xSbx Films With 0 < x ≦ 0.3Physica Status Solidi (b), 1987
- Thermal sensors based on the seebeck effectSensors and Actuators, 1986
- General expression for the temperature coefficient of resistivity of polycrystalline semi-metal filmsJournal of Materials Science, 1985
- Experimental verification of new theoretical equation describing electrical conductivity of thin filmsJournal of Materials Science Letters, 1985
- Calcul de la sensibilité et de la constante de temps d'une thermopile à éléments en couches minces et structure radialeRevue de Physique Appliquée, 1983
- The thermoelectric power of polycrystalline semimetal filmsPhysica Status Solidi (a), 1982
- The thermoelectric power and the temperature coefficient of resistance of thin polycrystalline antimony filmsThin Solid Films, 1981
- Effect of grain boundary scattering on the electrical conductivity of antimony filmsThin Solid Films, 1980