Detector geometry, thermal diffuse scattering and strain effects in ADF STEM imaging
Open Access
- 5 April 1995
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 58 (1) , 6-17
- https://doi.org/10.1016/0304-3991(94)00173-k
Abstract
No abstract availableKeywords
This publication has 28 references indexed in Scilit:
- High-resolution Z-contrast imaging of crystalsPublished by Elsevier ,2002
- Simultaneous STEM imaging and electron energy-loss spectroscopy with atomic-column sensitivityNature, 1993
- Mapping sp2 and sp3 states of carbon at sub-nanometre spatial resolutionNature, 1993
- Atomic-resolution chemical analysis using a scanning transmission electron microscopeNature, 1993
- An image and spectrum acquisition system for a VG HB501 stem using a color graphics workstationUltramicroscopy, 1990
- Dynamic theory of high-angle annular-dark-field stem lattice images for a Ge/Si interfaceUltramicroscopy, 1990
- High-resolution imaging of silicon (111) using a 100 keV STEMUltramicroscopy, 1990
- Simulating high-angle annular dark-field stem images including inelastic thermal diffuse scatteringUltramicroscopy, 1989
- Z-contrast stem for materials scienceUltramicroscopy, 1989
- Chemically sensitive structure-imaging with a scanning transmission electron microscopeNature, 1988