Filamentary Thermal Breakdown in Thin Dielectrics
- 1 January 1972
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 43 (1) , 15-18
- https://doi.org/10.1063/1.1660800
Abstract
A model of the breakdown of thin dielectric films is presented in which breakdown can result from thermal effects following a nondestructive electron avalanche. It is proposed that the avalanche leads to the generation of sufficient heat in a narrow channel for the ordinary electrical conductivity of the channel to be raised to a level at which thermal runaway could start, thus leading to destructive breakdown in a narrow region of the dielectric. The effects, on the time required for breakdown to occur, of input power, heat dissipation, and initial temperature rise caused by the avalanche are computed.This publication has 9 references indexed in Scilit:
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