Abstract
A new type of compensation wall located at the interface of thin rare‐earth transition‐metal double layers was studied in terms of a simple wall model. The magnetic field dependence of the wall energy and thickness was calculated yielding a variation of both by a factor of 3 in fields up to 1.6×106 A/m. Strong changes of the relative magnetization result for wall thicknesses that are comparable with the film thickness. The calculated variation of the relative magnetization with the field indicates that these changes can be directly observed by magnetization measurements. This opens new possibilities in the study of domain wall structures.

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