The characterisation of the ordering of movpe grown III–V alloys using transmission electron microscopy
- 1 April 1990
- journal article
- Published by Elsevier in Surface Science
- Vol. 228 (1-3) , 102-107
- https://doi.org/10.1016/0039-6028(90)90268-d
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Composition determination in the GaAs/(Al, Ga)As system using contrast in dark-field transmission electron microscope imagesPhilosophical Magazine A, 1989
- Transmission electron microscopic study of the ordered structure in GaInP/GaAs epitaxially grown by metalorganic chemical vapor depositionApplied Physics Letters, 1988
- Quantitative high resolution transmission electron microscopy: the need for energy filtering and the advantages of energy‐loss imagingJournal of Microscopy, 1988
- Ordered structure in OMVPE-grown Ga0.5In0.5PJournal of Crystal Growth, 1988
- Microdiffraction Application to short-range order in a quenched copper-platinum alloyPhilosophical Magazine, 1977