The role of wire imperfections in micro magnetic traps for atoms

Preprint

10 March 2004

preprint
Published by arXiv in arXiv

Abstract

We present a quantitative study of roughness in the magnitude of the magnetic field produced by a current carrying microwire, i.e. in the trapping potential for paramagnetic atoms. We show that this potential roughness arises from deviations in the wire current flow due to geometric fluctuations of the edges of the wire : a measurement of the potential using cold trapped atoms agrees with the potential computed from the measurement of the wire edge roughness by a scanning electron microscope.

Keywords

WIRE IMPERFECTIONS
QUANTITATIVE STUDY
MICRO MAGNETIC
MAGNETIC TRAPS
TRAPPED ATOMS
WIRE EDGE
ROUGHNESS

All Related Versions

Version 1, 2004-03-01, ArXiv
Version 2, 2004-03-08, ArXiv
Version 3, 2004-03-10, ArXiv
Version 4, 2004-03-16, ArXiv
Version 5, 2004-07-23, ArXiv
Published version: Physical Review A, 70 (4), 043629.

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