Role of wire imperfections in micromagnetic traps for atoms
- 29 October 2004
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review A
- Vol. 70 (4) , 043629
- https://doi.org/10.1103/physreva.70.043629
Abstract
We present a quantitative study of roughness in the magnitude of the magnetic field produced by a current carrying microwire, i.e., in the trapping potential for paramagnetic atoms. We show that this potential roughness arises from deviations in the wire current flow due to geometric fluctuations of the edges of the wire: a measurement of the potential using cold trapped atoms agrees with the potential computed from the measurement of the wire edge roughness by a scanning electron microscope.Keywords
All Related Versions
This publication has 14 references indexed in Scilit:
- Impact of the Casimir-Polder Potential and Johnson Noise on Bose-Einstein Condensate Stability Near SurfacesPhysical Review Letters, 2004
- Cold atoms probe the magnetic field near a wireJournal of Physics B: Atomic, Molecular and Optical Physics, 2003
- Spin Coupling between Cold Atoms and the Thermal Fluctuations of a Metal SurfacePhysical Review Letters, 2003
- Bose-Einstein Condensates near a Microfabricated SurfacePhysical Review Letters, 2003
- Thermally Induced Losses in Ultra-Cold Atoms Magnetically Trapped Near Room-Temperature SurfacesJournal of Low Temperature Physics, 2003
- Anomalous longitudinal magnetic field near the surface of copper conductorsJournal of Physics B: Atomic, Molecular and Optical Physics, 2002
- Surface effects in magnetic microtrapsPhysical Review A, 2002
- Propagation of Bose-Einstein Condensates in a Magnetic WaveguidePhysical Review Letters, 2002
- Bose-Einstein Condensation in a Surface MicrotrapPhysical Review Letters, 2001
- Bose–Einstein condensation on a microelectronic chipNature, 2001