Methods for kinetic analysis of thermally stimulated processes
- 1 August 1976
- journal article
- Published by Springer Nature in Journal of Materials Science
- Vol. 11 (8) , 1521-1541
- https://doi.org/10.1007/bf00540887
Abstract
No abstract availableKeywords
This publication has 182 references indexed in Scilit:
- Thermally stimulated current measurements on silicon junctions produced by implantation of low energy boron ionsSolid-State Electronics, 1974
- Theory of non-steady-state interfacial thermal currents in MOS devices, and the direct determination of interfacial trap parametersSolid-State Electronics, 1974
- Theory of transient emission current in MOS devices and the direct determination interface trap parametersSolid-State Electronics, 1974
- ITC with reciprocal heating schemePhysica Status Solidi (a), 1972
- The role of auger effect in thermostimulated phenomena in ionic crystalsThe European Physical Journal A, 1972
- Thermal Currents from Corona Charged MylarJournal of Applied Physics, 1970
- On the analysis of thermostimulated excitation curvesSolid-State Electronics, 1970
- New methods for determining electron trap parameters from thermoluminescent or conductivity ‘glow curves’Journal of Physics and Chemistry of Solids, 1969
- The Application of Differential Thermal Analysis to the Study of Reaction Kinetics1Journal of the American Chemical Society, 1957
- Spitzenz hler und Z hlrohr bei metallographischen Oberfl chenuntersuchungenThe European Physical Journal A, 1949