Advanced techniques for GA-based sequential ATPGs
- 1 January 1996
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
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- HITEC: a test generation package for sequential circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
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- Sequential circuit test generation in a genetic algorithm frameworkPublished by Association for Computing Machinery (ACM) ,1994
- Redundancy identification/removal and test generation for sequential circuits using implicit state enumerationIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1993
- CRIS: A test cultivation program for sequential VLSI circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1992