CONTEST: a concurrent test generator for sequential circuits

This publication has 11 references indexed in Scilit:

• Threshold-Value Simulation and Test Generation
  Published by Springer Nature ,1988
• An Artificial Intelligence Approach to Test Generation
  Published by Springer Nature ,1987
• An Effective Test Generation System for Sequential Circuits
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,1986
• Hitest: A Knowledge-Based Test Generation System
  IEEE Design & Test of Computers, 1984
• Controllability/observability analysis of digital circuits
  IEEE Transactions on Circuits and Systems, 1979
• Generation of Hazard Free Tests Using the D-Algorithm in a Timing Accurate System for Logic and Deductive Fault Simulation
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,1979
• EBT: A Comprehensive Test Generation Technique for Highly Sequential Circuits
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,1978
• A Nine-Valued Circuit Model for Test Generation
  IEEE Transactions on Computers, 1976
• Concurrent simulation of nearly identical digital networks
  Computer, 1974
• A Heuristic Algorithm for the Testing of Asynchronous Circuits
  IEEE Transactions on Computers, 1971