Effect of Hot Carriers on the Thermal Noise of p-Type Silicon and in SCLC Single Injection Diodes
- 1 January 1978
- book chapter
- Published by Springer Nature
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Survey of Noise of Hot Carriers: Some Experimental and Theoretical AspectsPublished by Springer Nature ,1978
- Noise in Single and Double Injection Currents in Solids (II)Physica Status Solidi (b), 1975
- Noise in single injection diodes. II. ApplicationsJournal of Applied Physics, 1975
- Thermal equilibrium noise of space charge limited current in silicon for holes with field-dependent mobilitySolid-State Electronics, 1975
- Treatment of Microscopic Fluctuations in Noise TheoryBell System Technical Journal, 1974