The BACK algorithm for sequential test generation

This publication has 8 references indexed in Scilit:

• SPLIT circuit model for test generation
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
• On the Acceleration of Test Generation Algorithms
  IEEE Transactions on Computers, 1983
• An Implicit Enumeration Algorithm to Generate Tests for Combinational Logic Circuits
  IEEE Transactions on Computers, 1981
• Controllability/observability analysis of digital circuits
  IEEE Transactions on Circuits and Systems, 1979
• EBT: A Comprehensive Test Generation Technique for Highly Sequential Circuits
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,1978
• A Nine-Valued Circuit Model for Test Generation
  IEEE Transactions on Computers, 1976
• A Heuristic Algorithm for the Testing of Asynchronous Circuits
  IEEE Transactions on Computers, 1971
• Programmed Algorithms to Compute Tests to Detect and Distinguish Between Failures in Logic Circuits
  IEEE Transactions on Electronic Computers, 1967