SPLIT circuit model for test generation
- 6 January 2003
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
A novel circuit model, SPLIT, is presented which is a modified 9-valued circuit model. SPLIT has the precision of the 9-valued model and the simplicity of the 5-valued model. So that its D-algorithm has better performance than that of the 5-valued or the 9-valued model.Keywords
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