X-Ray Diffraction Study of the Ge(001) Reconstructed Surface
- 20 April 1981
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 46 (16) , 1081-1084
- https://doi.org/10.1103/physrevlett.46.1081
Abstract
Standard x-ray diffraction in which a reflection goemetry is used is shown to have a simple interpretation and adequate sensitivity for determining the structure of monolayers. It has been utilized to verify that subsurface strain occurs in Ge(001)-(2×1) reconstruction.Keywords
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