Temperature-dependent resistivity measurements on polycrystalline SiO2-covered thin nickel films
- 1 July 1987
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 150 (2-3) , 209-215
- https://doi.org/10.1016/0040-6090(87)90092-7
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
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