Electronic and atomic structure of the Cu/Si(111) ‘quasi-5×5’ overlayer

This publication has 26 references indexed in Scilit:

• Microscopic structure, discommensurations, and tiling of Si(111)/Cu-‘‘5×5’’
  Physical Review B, 1992
• Cu:Si(111) incommensurate (5.55×5.55) surface reconstruction: Helium-beam measurements of diffraction and surface phonons
  Physical Review B, 1989
• Nucleation of Cu on Si(111)7 × 7 and atomic structure of the Cu/Si(111) interface
  Surface Science, 1989
• Phase Separation on an Atomic Scale: The Formation of a Novel Quasiperiodic 2D Structure
  Physical Review Letters, 1989
• Examination of the cu/si(111) 5×5 structure by scanning tunneling microscopy
  Physical Review B, 1988
• AES, LEED and TDS studies of Cu on Si(111)7 × 7 and Si(100)2 × 1
  Surface Science, 1987
• Atomic structure of the Cu/Si(111) interface by high-energy core-level Auger electron diffraction
  Physical Review B, 1985
• 7 × 7 Si(111)Cu interfaces: Combined LEED, AES and EELS measurements
  Surface Science, 1985
• Compound formation and bonding configuration at the Si-Cu interface
  Physical Review B, 1983
• Auger electron spectroscopy of Si
  Surface Science, 1970