Nucleation of Cu on Si(111)7 × 7 and atomic structure of the Cu/Si(111) interface

Publisher Website

1 April 1989

journal article
Published by Elsevier in Surface Science

Vol. 211-212, 133-142
https://doi.org/10.1016/0039-6028(89)90763-2

Abstract

No abstract available

Keywords

ATOMIC STRUCTURE

This publication has 6 references indexed in Scilit:

Scanning tunneling microscopy and spectroscopy on 7 × 7 reconstructed Si(111) surfaces containing defects
Surface Science, 1988
Observation of Atomic Corrugation on Au(111) by Scanning Tunneling Microscopy
Physical Review Letters, 1987
AES, LEED and TDS studies of Cu on Si(111)7 × 7 and Si(100)2 × 1
Surface Science, 1987
Surface Electronic Structure of Si (111)-(7×7) Resolved in Real Space
Physical Review Letters, 1986
Structural analysis of Si(111)-7×7 by UHV-transmission electron diffraction and microscopy
Journal of Vacuum Science & Technology A, 1985
7 × 7 Si(111)Cu interfaces: Combined LEED, AES and EELS measurements
Surface Science, 1985