Ballistic electron studies and modification of the Au/Si interface
- 24 December 1990
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 57 (26) , 2826-2828
- https://doi.org/10.1063/1.103754
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- Direct investigation of subsurface interface electronic structure by ballistic-electron-emission microscopyPhysical Review Letters, 1988
- Chemical and electronic structure of the SiO2/Si interfaceMaterials Science Reports, 1986
- Low Temperature Surface Cleaning of Silicon and Its Application to Silicon MBEJournal of the Electrochemical Society, 1986
- Photoemission studies of atomic redistribution at gold–silicon and aluminum–silicon interfacesJournal of Vacuum Science & Technology A, 1984