The effects of misfit dislocation nucleation and propagation on Si/Si1-xGex critical thickness values
- 1 February 1989
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 94 (2) , 392-404
- https://doi.org/10.1016/0022-0248(89)90014-6
Abstract
No abstract availableKeywords
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