Characterization of microwave integrated circuits using an optical phase-locking and sampling system
- 9 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- No. 0149645X,p. 507-510
- https://doi.org/10.1109/mwsym.1991.147048
Abstract
Using an optical technique, phase-locked microwave signals of up to 15 GHz from voltage-controlled oscillators have been achieved. Combining this technique with a photoconductive switch, a novel microwave waveform sampling system that displays the characteristics of oscillators and amplifiers has been demonstrated. The approach has potential applications for optically phase-locked microwave subsystems and monolithic integrated circuit characterizations.<>Keywords
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