Estimation of direct current bias and drift of Ti:LiNbO3 optical modulators
- 1 August 1994
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 76 (3) , 1405-1408
- https://doi.org/10.1063/1.357743
Abstract
The dc drift data of Ti:LiNbO3 optical modulators are well fitted to an exponential equation, describing the relaxation phenomena of the dielectric materials. The relaxation time and the saturation voltage ratio, which are necessary to estimate the dc bias follow‐up control, can be obtained from simple dc drift measurements.This publication has 7 references indexed in Scilit:
- Studies of thermal drift as a source of output instabilities in Ti:LiNbO3 optical modulatorsJournal of Applied Physics, 1994
- Possibility of dc drift reduction of Ti:LiNbO3 modulators via dry O2 annealing processApplied Physics Letters, 1994
- Refractive index fluctuations in deformed Ti:LiNbO3 waveguides due to SiO2 overlayer depositionApplied Physics Letters, 1993
- Temperature dependence of dc drift of Ti:LiNbO3 optical modulators with sputter deposited SiO2 buffer layerJournal of Applied Physics, 1993
- Minimizing dc drift in LiNbO3 waveguide devicesApplied Physics Letters, 1985
- Circuit effect in LiNbO_3 channel-waveguide modulatorsOptics Letters, 1985
- DC Drift Phenomena in LiNbO3 Optical Waveguide DevicesJapanese Journal of Applied Physics, 1981