Characterization of surfaces of laser-annealed samples by ellipsometry
- 30 June 1980
- journal article
- Published by Elsevier in Surface Science
- Vol. 96 (1-3) , 319-328
- https://doi.org/10.1016/0039-6028(80)90310-6
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- Pulsed-laser annealing of ion-implanted polycrystalline silicon filmsApplied Physics Letters, 1979
- Laser-induced recrystallization and damage in GaAsApplied Physics Letters, 1979
- Time-resolved reflectivity of ion-implanted silicon during laser annealingApplied Physics Letters, 1978
- Characterization of defects in real surfaces by ellipsometrySurface Science, 1976
- Characterization of real surfaces of vitreous silica by ellipsometryMaterials Research Bulletin, 1974
- Characterization of real surfaces by ellipsometrySurface Science, 1972