High voltage LDMOS transistors in sub-micron SOI films
- 23 December 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- Comparison of junction-isolated and soi high-voltage devices operating in the source-follower modePublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- Dependence of breakdown voltage on drift length and buried oxide thickness in SOI RESURF LDMOS transistorsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Comparison of self-heating effects in bulk-silicon and SOI high-voltage devicesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Realization of high breakdown voltage (<700 V) in thin SOI devicesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Self-heating effect in lateral DMOS on SOIPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Implemention of linear doping profiles for high voltage thin-film SOI devicesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002