Aperture contrast in thick amorphous specimens using scanning transmission electron microscopy
- 31 December 1975
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 1 (2) , 127-136
- https://doi.org/10.1016/s0304-3991(75)80015-5
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- Thick specimens in the CEM and STEM. I. ContrastJournal of Applied Physics, 1974
- Measurement of the top bottom effect in scanning transmission electron microscopy of thick amorphous specimensJournal of Microscopy, 1974
- Line patterns in wide-angle convergent beam electron diffractionJournal of Applied Crystallography, 1971
- IMAGE CONTRAST IN A TRANSMISSION SCANNING ELECTRON MICROSCOPEApplied Physics Letters, 1969
- Reciprocity in electron diffraction and microscopyActa Crystallographica Section A, 1968