Fourier transform-ion cyclotron resonance mass spectrometry — A new tool for measuring highly charged ions in an electron beam ion trap
- 1 May 1995
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 98 (1-4) , 558-561
- https://doi.org/10.1016/0168-583x(95)00011-9
Abstract
No abstract availableThis publication has 11 references indexed in Scilit:
- Production and Trapping of Hydrogenlike and Bare Uranium Ions in an Electron Beam Ion TrapPhysical Review Letters, 1994
- First Fourier‐transform ion cyclotron resonance signals of very highly charged atomic ionsRapid Communications in Mass Spectrometry, 1994
- High-frequency fourier transform ion cyclotron resonance mass spectrometryJournal of the American Society for Mass Spectrometry, 1993
- Fourier Transform Ion Cyclotron Resonance of highly-charged atomic ionsPhysica Scripta, 1992
- X-ray measurement of the ionization balance in an electron beam ion trapNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1992
- Fourier transform ion cyclotron resonance mass spectrometry: technique developmentsInternational Journal of Mass Spectrometry and Ion Processes, 1992
- Dielectronic-recombination cross sections of hydrogenlike argonPhysical Review A, 1991
- Production of high-charge-state thorium and uranium ions in an electron-beam ion trapPhysical Review A, 1991
- The Electron Beam Ion Trap: A New Instrument for Atomic Physics MeasurementsPhysica Scripta, 1988
- Fourier transform ion cyclotron resonance spectroscopyChemical Physics Letters, 1974