The formation and interpretation of defect images from crystalline materials in a scanning transmission electron microscope
- 1 January 1976
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 1 (3-4) , 239-253
- https://doi.org/10.1016/0304-3991(76)90038-3
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- The microanalysis of light elements using transmitted energy loss electronsUltramicroscopy, 1975
- Imaging of crystalline substances in scanning transmission electron microscopyPhysica Status Solidi (a), 1975
- Electron microscope study of electrically active impurity precipitate defects in siliconPhilosophical Magazine, 1974
- Nucleation and growth of stacking faults in epitaxial silicon during thermal oxidationJournal of Applied Physics, 1973
- Diffraction Patterns Obtained by Scanning Electron MicroscopeZeitschrift für Naturforschung A, 1972
- High resolution scanning microscopy of biological specimensPhilosophical Transactions of the Royal Society of London. B, Biological Sciences, 1971
- Neutron irradiation damage in molybdenumPhilosophical Magazine, 1971
- Electron Microscope Image Contrast from Dislocation LoopsPhysica Status Solidi (b), 1971
- IMAGE CONTRAST IN A TRANSMISSION SCANNING ELECTRON MICROSCOPEApplied Physics Letters, 1969
- Electron microscope image profiles of planar defects in crystalsPhilosophical Magazine, 1967