A far-infrared spectrometer based on cyclotron resonance emission sources

1 June 1992

journal article
Published by AIP Publishing in Review of Scientific Instruments

Vol. 63 (6) , 3293-3297
https://doi.org/10.1063/1.1142540

Abstract

Practical realization of the spectrometer based on the cyclotron emission sources is presented. It is shown that it can be used for transmission measurements in the range from 35 to 110 cm⁻¹ with resolution up to 1.3 cm⁻¹. Performances of the spectrometer are demonstrated by its application to the studies of impurity and free‐electron states in two‐dimensional structures.

Keywords

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