Soft error immunity in a DRAM investigated by nuclear microprobes
- 1 May 1993
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 77 (1-4) , 344-348
- https://doi.org/10.1016/0168-583x(93)95564-l
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Single event upset imaging with a nuclear muprobeNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1992
- FORMATION OF HIGH ENERGY MICROBEAMS AND THEIR APPLICATION TO MICROELECTRONICSInternational Journal of PIXE, 1992
- Alpha-particle tracks in silicon and their effect on dynamic MOS RAM reliabilityIEEE Transactions on Electron Devices, 1979
- Alpha-particle-induced soft errors in dynamic memoriesIEEE Transactions on Electron Devices, 1979