Testability analysis of analog systems
- 1 June 1990
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Vol. 9 (6) , 573-583
- https://doi.org/10.1109/43.55186
Abstract
A method is presented to analyze the testability of both linear and nonlinear analog systems. It combines a rank-test algorithm with statistical methods. The algorithm will find sets of dependent parameters and determine whether it is possible to calculate a certain parameter with sufficient accuracy. it also determines a subset of appropriate measurements if redundant measurements are presenKeywords
This publication has 5 references indexed in Scilit:
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