Photoreflectance spectroscopy of pseudomorphic Si1−XGex (100) structures (x<0·26)
- 1 April 1995
- journal article
- Published by SAGE Publications in Materials Science and Technology
- Vol. 11 (4) , 416-420
- https://doi.org/10.1179/026708395790164940
Abstract
No abstract availableThis publication has 13 references indexed in Scilit:
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