Dielectric function spectra of strained and relaxed Si1−xGex alloys (x=0–0.25)
- 1 May 1994
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 75 (9) , 4642-4647
- https://doi.org/10.1063/1.355914
Abstract
Dielectric function spectra for strained and relaxed Si1−xGex alloys with x∼0.13 and 0.20 are presented in numerical form. The effect of strain is shown to cause a modification of the spectra in the E1 critical point region, resulting in a decrease in refractive index at 1.96 eV, amounting to 0.06 at x=0.22. The spectral dependence of the refractive index is presented for a series of strained layers. An overview is given of spectral databases and the single‐wavelength ellipsometry data available in the literature.This publication has 23 references indexed in Scilit:
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