In-situ dual-wavelength and ex-situ spectroscopic ellipsometry studies of strained SiGe epitaxial layers and multi-quantum well structures
- 1 October 1993
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 233 (1-2) , 126-130
- https://doi.org/10.1016/0040-6090(93)90073-x
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
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