Characterization of In0.5Ga0.5As quantum dot p-i-n structures with different matrices
- 1 May 1999
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 201-202, 1168-1171
- https://doi.org/10.1016/s0022-0248(99)00013-5
Abstract
No abstract availableKeywords
This publication has 13 references indexed in Scilit:
- Matrix-dependent structural and photoluminescence properties of In0.5Ga0.5As quantum dots grown by molecular beam epitaxySolid-State Electronics, 1998
- Formation of self-organized In0.5Ga0.5As quantum dots on GaAs by molecular beam epitaxyJournal of Crystal Growth, 1997
- Injection heterolaser based on an array of vertically aligned InGaAs quantum dots in a AlGaAs matrixSemiconductors, 1997
- Ordered arrays of quantum dots: Formation, electronic spectra, relaxation phenomena, lasingSolid-State Electronics, 1996
- Room temperature CW operation at the ground stateof self-formed quantum dot lasers with multi-stacked dot layerElectronics Letters, 1996
- Self-Formed In0.5Ga0.5As Quantum Dots on GaAs Substrates Emitting at 1.3 µmJapanese Journal of Applied Physics, 1994
- Low threshold, large
T
o
injectionlaser emissionfrom (InGa)As quantum dotsElectronics Letters, 1994
- Direct formation of quantum-sized dots from uniform coherent islands of InGaAs on GaAs surfacesApplied Physics Letters, 1993
- Gain and the threshold of three-dimensional quantum-box lasersIEEE Journal of Quantum Electronics, 1986
- Multidimensional quantum well laser and temperature dependence of its threshold currentApplied Physics Letters, 1982