Generation of radiation-induced defects at room temperature in silicon in a HVEM and their annihilation

This publication has 18 references indexed in Scilit:

• Radiation induced defects in silicon at room temperature
  Physica Status Solidi (a), 1980
• On the determination of the threshold energy for atomic displacement in semiconductors
  Radiation Effects, 1980
• Radiation-induced processes in experiments carried out in-situ in the high-voltage electron microscope
  Physica Status Solidi (a), 1979
• Identification of Small Defects in Silicon
  Physica Status Solidi (a), 1979
• Threshold voltage for damage in Si under electron bombardment
  Scripta Metallurgica, 1977
• The dynamic observation of the formation of defects in silicon under electron and proton irradiation
  Philosophical Magazine, 1973
• On silicon amorphization during different mass ion implantation
  Radiation Effects, 1973
• Observation of ion bombardment damage in silicon
  Philosophical Magazine, 1968
• Electron microscopy at high voltages
  Philosophical Magazine, 1968
• Conversion of crystalline germanium to amorphous germanium by ion bombardment
  Philosophical Magazine, 1965