A magnetic force microscopy analysis of soft thin film elements
- 1 January 1994
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 30 (6) , 4473-4478
- https://doi.org/10.1109/20.334124
Abstract
No abstract availableThis publication has 20 references indexed in Scilit:
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