Investigations of flash evaporated cub^IIIC₂^VI semiconductor thin films by Rutherford backscattering spectroscopy

This publication has 14 references indexed in Scilit:

• Adamantine ternary epitaxial layers
  Progress in Crystal Growth and Characterization, 1980
• Preparation of amorphous CuInSe2 thin films
  Thin Solid Films, 1980
• Growth and properties of sputter-deposited CuInS2 thin films
  Thin Solid Films, 1980
• Correction of the rutherford scattering cross section in the backscattering analysis
  Radiation Effects, 1980
• Measurement of lattice parameters of AIBIIICVI2 chalcopyrite-type epitaxial layers using reflection high energy electron diffraction
  Thin Solid Films, 1979
• Growth and electrical properties of epitaxial CuInS₂ thin films on GaAs substrates
  Crystal Research and Technology, 1979
• Epitaxial layers of CuInSe2 on GaAs
  Thin Solid Films, 1978
• Growth of CuInS2 and its characterization
  Revue de Physique Appliquée, 1978
• Untersuchung von A^IIIB‐Halbleitereinkristallen mittels Rutherford‐Rückstreuung energiereicher Protonen
  Crystal Research and Technology, 1975
• Anwendung der Protonen‐Rückstreuanalyse zur Bestimmung der Zusammensetzung von A^IIIB^V‐Mischkristallen
  Crystal Research and Technology, 1975